X-ray繞射分析儀-XRD

簡稱 XRD
中文名稱 X光繞射儀
英文名稱 X-ray Diffraction
圖片  image002
功能說明 New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control.
儀器服務項目 X光繞射分析(材料相鑑定、結晶顆粒大小分析、結晶度、定量…)、薄膜低掠角掃描、殘留應力分析、極圖分析與高解析Rocking Curve分析等。
儀器購置日期 99/04
儀器廠牌 日本 Rigaku
型號 MiniFlex II
儀器規格 最高功率:18W (60kV-300mA)

掃描範圍: -3° ~ +145°

掃瞄速度: 0.01~100°/min.

主要配件 X光產生器(Tube output voltage: 30 kV,Tube output current: 15 mA,High-frequency Cockcroft-Walton method,Within ±0.05% for both the tube voltage and tube current, with reference to ±10% of input power variation)
樣品準備 晶體試片不可大於 2×2×0.2cm,亦不可太小。
注意事項 1.  不接受具揮發性與毒性之試片之粉末試樣。

2.  適用樣品型態:粉末與固體。